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　Material Analysis Systems

Molecular mass spectrometer (FT-ICR-MS)
This device is a mass spectrometer that uses ion cyclotron resonance(ICR). In measurement, ionized samples are subject to cyclotron motion in a high magnetic field, and confined within an ICR cell. Then, the resonance signal obtained by exposing them to a radio-wave pulse is Fourier transformed. This device produces a resolution from one to several hundred thousands, and its high sensitivity gives it the capacity to measure even pmol-fmol order samples.

Electron probe micro-analyzer (EPMA)
The EPMA is a scanning electron microscope with the added function of spectroscopic analysis
of characteristic X-rays. Since the characteristic X-rays that are emitted from the sample by means of electron beams are specific to it because of its elements,qualitative/quantitative analysis of the elements contained in the sample is possible. It is also possible to measure the element distribution on the sample surface through surface analysis.

Transmission electron microscope (TEM)
The transmission electron microscope (TEM) is a device that is used to observe and analyze the microstructure of materials. This device (HitachiHF-2000) can carry out X-ray analysis and analysis of the speed of electron rays of materials in the nanometer scale.

Rutherford backscattering analysis and
high-energy ion implantation system
This system makes high-energy ion beams hit the sample, and investigates the types of elements in the sample from the energy of the ions that bounce back, as well as the distribution of these elements in the depth direction. It can also reform the sample by ionizing all kinds of elements and inserting them into the sample with a maximum energyof 6.8MeV.

Photo: Rutherford backscattering analysis and high-energy ion implantation system

Laboratory Equipment

Name of Equipment	Manufacturers and types
Molecular mass spectrometer (FT-ICR-MS)	Bruker, Germany: BioAPEX 70e
Magnetic sector-type / time-of-flight mass spectrometer	VG Analytical, Fisons Instruments, UK
Rutherford backscattering analysis, high-energy ion implantation system	NHV Corporation: NT-1700H
4-axis x-ray crystal analyzer	Rigaku Corporation: RASA-7A
Gene/protein structure analysis system	Applied Biosystems, USA: 373A DNA Sequencer (complete set)
Scanning electron microscope (SEM)	Hitachi: S-4100
Transmission electron microscope (TEM)	Hitachi: HF-2000
Nuclear magnetic resonance spectrometer (NMR750MHz)	Varian, USA: UNITY plus 750
Nuclear magnetic resonance spectrometer for solutions (NMR500MHz)	Varian, USA: UNITYINOVA500
Solid-state nuclear magnetic resonance spectrometer (NMR400MHz)	Varian,USA: UNITYINOVA400WB
Paramagnetic resonance spectrometer (ESR)	JEOL: JES-RE3X
X-ray photoelectron spectroscopy system (ESCA)	Fisons Instruments, USA: S-ProbeTM2803
Extended X-ray absorption fine structure measuring system (EXAFS)	Technos: EXAC-820
Electron probe micro-analyzer (EPMA)	JEOL: JXA-8900
Cluster formation reaction analysis system	Sumitomo Heavy Industries: SCI-400, SCR-500JEOL: JSTM-4500VT

*These are just some of the main pieces of equipment -there are many more.
*There are more photos of lab equipment on the pages of the Center for Knowledge Science, the Center for Information Science and the Center for Nano Materials and Technology.