About JAIST
- President's Message The Mission and Goals of JAIST Video History Organization Administrative Staff Students Advanced Laboratory Facilities Data: Outline of JAIST The JAIST Foundation Publications
-
HOME > About JAIST > [Advanced Laboratory Facilities] Material Analysis Systems
Advanced Laboratory Facilities
Material Analysis Systems
Molecular mass spectrometer (FT-ICR-MS)This device is a mass spectrometer that uses ion cyclotron resonance(ICR). In easurement, ionized samples are subjected to cyclotron motion in a high magnetic field, and confined within an ICR cell. Then, the resonance signal obtained by exposing them to a radio-wave pulse is Fourier transformed. This device produces a resolution from one to several hundred thousands, and its high sensitivity gives it the capacity to measure even pmol-fmol order samples.
Electron probe micro-analyzer (EPMA)The EPMA is a scanning electron microscope with the added function of spectroscopic analysis of characteristic X-rays. Since the characteristic X-rays emitted from samples are specific to elements, qualitative/quantitative analysis of the elements in the sample is possible. It is also possible to measure the element distribution on the sample surface.
Transmission electron microscope (TEM)The TEM is an apparatus used to observe and analyze microstructures of materials. This apparatus, Hitachi HF-2000, also can be used for Energy Dispersive X-ray Spectroscopy (EDXS) and Electron Energy Loss Spectroscopy (EELS) of materials in the nanometer scale.
Focused ion beam system (FIB)Less than a few micron 3D micro-fabrications (thinning, etching, milling etc) were done by focusing ion-beam on the surfaces of metal, insulator, semiconductor etc. As an ion source, Ga ion-beam is used under a few tens keV acceleration.
Laboratory EquipmentName of Equipment Manufacturers and types Molecular mass spectrometer (FT-ICR-MS) Bruker, Germany: SolariX Magnetic sector-type / time-of-flight mass spectrometer VG Analytical, Fisons Instruments, UK Rutherford backscattering analysis, high-energy ion implantation system NHV Corporation: NT-1700H Four-circle x-ray crystal analyzer Rigaku Corporation: RASA-7A Gene/protein structure analysis system Applied Biosystems, USA: 373A DNA Sequencer (complete set) Scanning electron microscope (SEM) Hitachi: S-4100, S-5200 Transmission electron microscope (TEM) Hitachi: H-7650 JEOL: JEM-ARM200F Nuclear magnetic resonance spectrometer (NMR800MHz) Bruker, Germany: AVANCE Ⅲ 800 Nuclear magnetic resonance spectrometer for solutions (NMR500MHz) Bruker, Germany: AVANCE Ⅲ 500 Solid-state nuclear magnetic resonance spectrometer (NMR400MHz) Varian, USA: UNITYINOVA400WB Paramagnetic resonance spectrometer (ESR) JEOL: JES-RE3X X-ray photoelectron spectroscopy system (ESCA) Fisons Instruments, USA: S-ProbeTM2803 Focused ion beam system (FIB) SII: SMI3050 Electron probe micro-analyzer (EPMA) JEOL: JXA-8900 Cluster formation reaction analysis system Sumitomo Heavy Industries: SCI-400, SCR-500 JEOL: JSTM-4500VT * These are just some of the main pieces of equipment -there are many more.