Research Equipment
Atomic Resolution Scanning Transmission Electron Microscope (STEM)
(JEOL Ltd. JEM-ARM200F)
UTSA physics and astronomy department chair Dr. Miguel Yacaman, a renowned electron microscopist and nanotechnology researcher, tested the new ARM200F performance on Si <110> samples as the JEOL engineering, service and applications team worked closely together to install the TEM in UTSA’s Advanced Microscopy Lab.
“At the level of this new microscope, the potential for new discoveries is enormous,” says Yacaman, who likened the capabilities of the JEOL ARM200F for sub-atomic research to those of the Hubble telescope for intergalactic exploration. (Excerpt from JEOL’ website)
Features:
The JEM-ARM200F scanning transmission electron microscope, which incorporates a spherical aberration corrector, produces a scanning transmission image resolution (STEM-HAADF) of 0.08 nm as a result of its enhanced mechanical and electrical stability. Now that aberration-correction has been applied to the instrument, the electron probe features a current density level higher by an order of magnitude than that of conventional transmission electron microscopes. With its sharp, thin probe, the high current density ARM200F makes it possible to carry out atomic-level analysis. In addition, elemental analysis can be conducted with the energy dispersive X-ray analyzer.
Specifications: JEM-ARM200F
Accelerating voltage: 200 kV
Electron gun: Schottky field emission gun
Resolution:
0.08 nm (Scanning transmission image)
0.19 nm (Point image by transmission microscope)
0.10 nm (Lattice image by transmission microscope)
Magnification:
100 to 150,000,000 (Scanning transmission image)
50 to 2,000,000 (Transmission microscope image)
A spherical aberration corrector is incorporated.
