Equipment:

High-Resolution, Angle-Resolved Ultraviolet Photoelectron (ARUPS) Spectrometer: It consists of a VG Scienta SES-100 electron analyzer (energy resolution < 5 meV, angular resolution ~ 0.12 degree), two Helium discharge lamps, a Reflection High-Energy Electron Diffraction (RHEED) system, a Low-Energy Electron Diffraction (LEED) system) and a purpose-built sample preparation system. The spectrometer is especially suited for the preparation and study of thin films to be prepared at temperatures below room temperature. Substrates can be heated either indirectly up to about 900 K or by direct current heating up to about 1500 K and sputtered using a neutral atom sputter source.

Angle-Resolved Ultraviolet Photoelectron Spectroscopy (ARUPS) and Resonant Photoemission (RPES): at beamlines located at the MAX-Lab (Lund, Sweden) and Photon Factory (Tsukuba, Japan) synchrotron light sources

X-ray photoelectron spectroscopy (XPS): equipment located at JAIST

Atomic Force Microscopy (AFM): equipment located at JAIST

Differential Thermal Analysis/Differential Scanning Calorimetry (DTA/DSC) (SETARAM, France) apparatus for the study of phase transitions.