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Masahiko Tomitori Professor
School of Materials Science、Applied Physics Area


M.S.(1982), Ph.D.(1986) from Tokyo Institute of Technology

■Professional Career

Visiting Scholar at Lawrence Berkeley Laboratory, University of California(1991)


Surface Science, Solid State Physics, nanoprobe technology, Nano Mechanics

■Research Keywords

scanning probe microscopy, scanning tunnelng microscopy, atomic force microscopy, field emission

■Research Interests

Observation and analysis of surface structures and electronic states on a nano scale by developing instrumentation toward new microscopy and spectroscopy
We develop new methods and construct new instruments on the basis of scanning probe techniques, mainly operated in ultrahigh vacuum.

Study of surfaces of semiconductors, metals and oxides with an atomic resolution, thin film growth on them, fabrication of nano structures and field emission related phenomena
We observe condensed matter surfaces and thin film growth with an atomic resolution, and analyze surface electronic states by scanning tunneling spectroscopy and the related techniques. Furthermore, we fabricate nano structures utilizing specific surface structures and hetero growth with strain.

Development of nana-mechanics toward atom and molecule manipulation and assembly, and study of reactive dynamics of atoms and molecules on surfaces
We develop novel nano-scale mechanics “nano-mechanics” using noncontact atomic force microscopy (nc-AFM), which is one of new nano-probe techniques, and apply it to manipulation and assembly of individual atoms and molecules on surfaces. Nano-mechanics with nc-AFM has great potential for analysis of surface reaction and fabrication of nano-devices on insulators. This leads to a next generation of science and technology for individual atoms and molecules.



  • Bias dependence of NC-AFM images and tunneling current variations on semiconductor surfaces, Noncontact Atomic Force Microscopy,T. Arai and M. Tomitori,edited by S. Morita et al.,Springer-Verlag, Berlin,2002,72-92
  • "STM/STS Study of Semiconductor Clusters", Mesoscopic Materials and Clusters: Their Physical and Chemical Properties, edited by T.Arai, K.Mihama, K.Yamamoto and S.Sugano, Springer Series in Cluster Physics,M. Tomitori,Springer-Verlag, Kodansha, Tokyo,1999,419-427
  • Applied Scanning Probe Methods IX,B. Bhushan, H. Fuchs, M. Tomitori (eds),Springer-Verlag,2008/03/05

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◇Published Papers

  • Quasi-stabilized hydration layers on muscovite mica under a thin water film grown from humid air,Toyoko Arai, Kohei Sato, Asuka Iida, and Masahiko Tomitori,Scientific Reports,7,4054, 11 pages,2017/06/22
  • XPS and STM study of TiO2(110)-(1×1) surfaces immersed in simulated body fluid,A. Sasahara, T. Murakami, and M. Tomitori,Surface Science,online,2017/10/21
  • Nanoscale characterisation of TiO2(110) annealed in air,Akira Sasahara, Tatsuya Murakami, Tu Tran Uyen Le and Masahiko Tomitori,Applied Surface Science,on line,2017/9/29

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◇Lectures and Presentations

  • Surface electron spectroscopy using scanning probe microscopy from field-emission to force interaction under a tip-sample bias voltage (invited),Masahiko Tomitori,MRS fall meeting 2007,Boston,2007/11/26-30
  • Ex-situ STM and XPS analysis of TiO2(110) surfaces to humid environments,A. Sasahara, T. Murakami, and M. Tomitori,Symposium on Surface Sciences and Nanotechnology ―25th Anniversary of SSSJ Kansai,International Community House, Kyoto,2017/1/25–26
  • Displacement of Si adatoms on Si(111)-(7×7) through Si tip approach,Toyoko Arai, Ryo Inamura, Daiki Kura, Masahiko Tomitori,20th International conference on non-contact atomic force microscopy 2017 (nc-AFM2017),Garden Hotel Suzhou, Suzhou, China,2017/9/25-29

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■Extramural Activities

◇Academic Society Affiliations

  • American Vacuum Society,2002-

◇Other Activities

  • Japan Society for the Promotion of Science, 167th committee on nano-probe technology,committee member (1997-)
  • 8th Asia-Pacific Conference on Electron Microscopy,local organizing committee (2001-2004)
  • the 17th international conference on non-contact atomic force microscopy,program committee,2014/01/01 - 2014/08/08

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