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ナノマテリアルテクノロジーセンターCenter for Nano Materials and Technology 2F


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Xiaobin Zhang Assistant Professor
School of Materials Science


Bachelor of Engineering(Zhengzhou University)(2005), Master of Engineering(National University of Defense Technology)(2007), Ph.D from Saitama Institute of Technology (2012)

■Professional Career

Postdoctoral Researcher at Transmission Electron Microscopy Station, National Institute for Materials Science(2013), Researcher at Quantum Nanoelectronics Research Center, Tokyo Institute of Technology(2015), Researcher at Japan Advanced Institute of Science and Technology (2017)


Transmission Electron Microscopy, Nanomaterial, 2D materials

■Research Keywords

High resolution TEM observation, graphene, measurement of electrical conductivity


◇Published Papers

  • Interaction study of nitrogen ion beam with silicon,M. E. Schmidt, X. Zhang, Y. Oshima, L. T. Anh, A. Yasaka, T. Kanzaki, M. Muruganathan, M. Akabori, T. Shimoda and H. Mizuta,Journal of Vacuum Science & Technology B,35,03D101,2017/02
  • Three-dimensional characterization of Guinier–Preston zones in an Al–Cu alloy using depth-sectioning technique,T. Hamaoka, C. Y. Jao, X. Zhang, Y. Oshima and M. Takeguchi,Microscopy,66,78−88,2016/12/7
  • 強度輸送方程式を用いた位相マッピング,大島 義文,張 暁賓,顕微鏡,52,1,19−23,2017/3/21

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■Extramural Activities

◇Academic Society Affiliations

  • The Surface Science Society of Japan,Regular member,2016-
  • The Japan Society of Applied Physics,Regular member,2015-
  • The Japanese Sociey of Microscopy,Regular member,2011-