北陸先端科学技術大学院大学 [JAIST] - 研究者総覧
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富取 正彦 (トミトリ マサヒコ) 教授
マテリアルサイエンス研究科(マテリアルサイエンス専攻・物性解析・デバイス領域)

69件中1-20件目

  • 1. XPS and STM study of TiO2(110)-(1×1) surfaces immersed in simulated body fluid,A. Sasahara, T. Murakami, and M. Tomitori,Surface Science,668,61, 7 pages,2017/10/21
  • 2. Nanoscale characterisation of TiO2(110) annealed in air,Akira Sasahara, Tatsuya Murakami, Tu Tran Uyen Le and Masahiko Tomitori,Applied Surface Science,428,1000, 6 pages,2017/9/29
  • 3. Resistivity change in Joule heat energy dissipation detected by noncontact atomic force microscopy using a silicon tip terminated with/without atomic hydrogen,Toyoko Arai, Ryo Inamura, Daiki Kura, and Masahiko Tomitori,Japanese Journal of Applied Physics,Accepted
  • 4. Energy dissipation unveils atomic displacement in the noncontact atomic force microscopy imaging of Si(111)-(7×7),Toyoko Arai, Ryo Inamura, Daiki Kura, and Masahiko Tomitori,Physical Review B,97,115428, 6 pages,2018/03/19
  • 5. Two-dimensional, hierarchical Ag-doped TiO2 nanocatalysts: effect of the metal oxidation state on the photocatalytic properties,Siti Khatijah Md Saad, Akrajas Ali Umar, Marjoni Imamora Ali Umar, Masahiko Tomitori, Mohd. Yusri Abd. Rahman, Muhamad Mat Salleh, and Munetaka Oyama,ACS Omega,3,2579, 9 pages,2018/02/20
  • 6. Quasi-stabilized hydration layers on muscovite mica under a thin water film grown from humid air,Toyoko Arai, Kohei Sato, Asuka Iida, and Masahiko Tomitori,Scientific Reports,7,4054, 11 pages,2017/06/22
  • 7. Evaluation and optimization of quartz resonant-frequency retuned fork force sensors with high Q factors, and the associated electric circuits, for non-contact atomic force microscopy,H. Ooe, M. Fujii, M. Tomitori and T. Arai,Review of Scientific Instruments,87,023702, 8,2016/02/10
  • 8. Atomic-scale electric capacitive change detected with a charge amplifier installed in a non-contact atomic force microscope,M. Nogami, A. Sasahara, T. Arai and M. Tomitori,Applied Physics Express,9,046601, 4 pages,2016/02/25
  • 9. 真空環境を離れて原子分解能へ ―SPMの最近の進歩―,富取 正彦,顕微鏡,51,2,66、1,2016/08/30
  • 10. An atomic scale study of TiO2(110) surfaces exposed to humid environments,Akira Sasahara, Masahiko Tomitori,Journal of Physical Chemistry C,120,21427, 9 pages,2016/09/02
  • 11. Local protrusions formed on Si(111) surface by surface melting and solidification under applied tensile stress,Takashi Nishimura and Masahiko Tomitori,Applied Physics Letters,109,121201, 4 pages,2016/09/20
  • 12. Atom-resolved analysis of an ionic KBr(001) crystal surface covered with a thin water layer by frequency modulation atomic force microscopy,T. Arai, M. Koshioka, K. Abe, M. Tomitori, R. Kokawa, M. Ohta, H. Yamada, K. Kobayashi, and N. Oyabu,Langmuir,31,13,3876, 8,2015/03/19
  • 13. Hydration of MgO(100) surface promoted at <011> steps,A. Sasahara, T. Murakami, and M. Tomitori,J. Phys. Chem. C,119,8250, 8,2015/03/31
  • 14. Water wettability of Si(111) and (001) surfaces prepared to be reconstructed, atomic-hydrogen terminated and thinly oxidized in an ultrahigh vacuum chamber,T. Miyagi, A. Sasahara and M. Tomitori,Appl. Surf. Sci. 349 904-910,349,904, 7,2015/05/21
  • 15. Difference in etching of Si(111) and (001) surfaces induced by atomic hydrogen irradiation observed with non-contact atomic force microscopy,T. Miyagi, A. Sasahara and M. Tomitori, Jpn. J. Appl. Phys.,54,08LB08, 5,2015/07/24
  • 16. Thermal transformation of 4,4"-diamino-p-terphenyl on a Si(111)-7×7 surface analyzed by X-ray photoemission spectroscopy and scanning tunneling microscopy,T. Nishimura, A. Sasahara, H. Murata, T. Arai and M. Tomitori,J. Phys. Chem. C,118,25104, 6,2014/10/6
  • 17. Resonance frequency-retuned quartz tuning fork as a force sensor for noncontact atomic force microscopy,Hiroaki Ooe, Tatsuya Sakuishi, Makoto Nogami, Masahiko Tomitori and Toyoko Arai,Applied Physics Letters,105,043107, 4,2014/07/30
  • 18. Microscopic techniques bridging between nanoscale and micro scale with an atomically sharpened tip - field ion microscopy/scanning probe microscopy/ scanning electron microscopy,M. Tomitori and A. Sasahara,Microscopy,63,S1,i11, 1,2014/11
  • 19. Stable alignment of 4,4”-diamino-p-terphenyl chemically adsorbed on a Si(001)-(2×1) surface observed by scanning tunneling microscopy,Amer Mahmoud Amer Hassan, Takashi Nishimura, Akira Sasahara, Hideyuki Murata and Masahiko Tomitori,Surface Science,630,96, 5,2014/08/02
  • 20. 半導体表面構造・電荷分布の原子スケール解析を実現する走査プローブ顕微鏡,笹原 亮、富取 正彦,ポストシリコン半導体 -ナノ成膜ダイナミクスと基板・界面効果- 第4編 評価:解析,443?53

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