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Masahiko Tomitori Professor
School of Materials Science、Applied Physics Area

Results 1-20 of about 96

  • 1. Surface resistivity change detected by non-contact atomic force microscopy through Joule heat energy transfer,Toyota Arai, Daini Kura, Ryo Inamura, Masahiko Tomitori,The 21st International Conference on Non-contact Atomic Force Microscopy,Porvoo, Finland,2018/09/17-21
  • 2. Surface resistance change of Ge islands grown on Si(111)-(7×7) evaluated by Joule heat energy in non-contact atomic force microscopy,Daily Kura, Masahiro Tomitori, Toyoko Arai,14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14),Sendai International Center, Sendai, Miyagi,October 21–25, 2018
  • 3. Calcium phosphate precipitation sensitive to TiO2(110) surface nanostructure,Akira Sasahara, Tatsuya Murakami, Masahiko Tomitori,14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14),Sendai International Center, Sendai, Miyagi,October 21-25, 2018
  • 4. Nanomechanical responses of epitaxial silicone on ZrB2(0001) examined by non-contact atomic force microscopy,Makoto Nogami, Antoine Fleurence, Yukiko Yamada-Takamura, Masahiko Tomitori,14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14),Sendai International Center, Sendai, Miyagi,October 21–25, 2018
  • 5. Measurements of electronic conductance and mechanical properties of gold point contacts based on frequency modulation atomic force microscopy,H. Mitera, T. Murakami, R. Hashimoto, K. Ishizuka, Y. Oshima, M. Tomitori, T. Arai,14th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-14),Sendai International Center, Sendai, Miyagi,October 21–25, 2018
  • 6. Ex-situ STM and XPS analysis of TiO2(110) surfaces to humid environments,A. Sasahara, T. Murakami, and M. Tomitori,Symposium on Surface Sciences and Nanotechnology ―25th Anniversary of SSSJ Kansai,International Community House, Kyoto,2017/1/25–26
  • 7. Displacement of Si adatoms on Si(111)-(7×7) through Si tip approach,Toyoko Arai, Ryo Inamura, Daiki Kura, Masahiko Tomitori,20th International conference on non-contact atomic force microscopy 2017 (nc-AFM2017),Garden Hotel Suzhou, Suzhou, China,2017/9/25-29
  • 8. Energy dissipation detected by non-contact atomic force microscopy on Si(111)-(7×7) under bias voltage,Toyoko Arai, Daiki Kura, Ryo Inamura, and Masahiko Tomitori,the 25th International Colloquium on Scanning Probe Microscopy,Shizuoka, Kamo-gun, Atagawa Heights,2017/12/7-9
  • 9. Simultaneous NC-AFM imaging with current and damping energy using a retuned fork sensor with a high Q-value,H. Ooe, M. Fujii, M. Tomitori, T. Arai,the 18th International conference on non-contact atomic force microscopy,Cassis, France,2015/09/7-11
  • 10. Laying-down configuration of 4,4" diamond-p-terphenyl on Si(001)-2×1 observed by scanning tunneling microscopy,Amer Mahmoud Amer Hassan, Akira Sasahara, Hideyuki Murata, Masahiko Tomitori,EM-NANO 2015,TOKI MESSE Niigata Convention Center, Niigata, Japan,2015/06/16-19
  • 11. Dissipation decrease in a proximity region enhanced with a hydrogen-terminated Si tip in non-contact atomic force microscopy,R. Inamura, M. Tomitori, T. Arai,the 18th International Conference on non-contact atomic force microscopy,Cassis, France,2015/09/7-11
  • 12. Photo-induced super-hydrophilicity of SiO2 overlayers epitaxially grown on a rutile TiO2(110) surface,Le Tran Uyen Tu, A. Sasahara and M. Tomitori,7th International Workshop on Advanced Materials Science and Nanotechnology, IWAMSN 2014,Ha Long City, Vietnam,2014/11/2-6
  • 13. Change in water wettability under Cassie-Baxter law for SiO2 patched over layers epitaxially grown on a rutile TiO2(110) surface,Le Tran Uyen Tu, A. Sasahara and M. Tomitori,the 22th International Colloquium on Scanning Probe Microscopy ICSPM22,Atagawa, Shizuoka,2014/12/11-13
  • 14. Force spectroscopy of an NH3-reacted Si(111)-(7×7) surface by non-contact AFM with different tip states,T. Arai, Y. Sakano, R. Inamura and M. Tomitori,the 22th International Colloquium on Scanning Probe Microscopy ICSPM22,Atagawa, Shizuoka,2014/12/11-13
  • 15. Atom-resolved FM-AFM imaging of a KBr(001) surface covered with water layers in air with high humidity,T. Arai, M. Koshioka, K. Abe, M. Tomitori, R. Kokawa, M. Ohta, H. Yamada, K. Kobayashi, N. Oyabu,the 17th International Conference on non-contact atomic force microscopy,Tsukuba, Japan,2014/08/04-08
  • 16. Atomic contrast change of NH3-related Si(111)-7x7 surfaces observed by non-contact atomic force microscopy,Toyoko Arai, Yuki Sakano, Masahiko Tomitori,the 17th international conference on non-contact atomic force microscopy,Tsukuba, Japan,2014/08/04-08
  • 17. Silicon oxide layers hetero-epitaxially grown on rutile TiO2(110) surfaces observed by non-contact atomic force microscopy in water,Le Tran Uyen Tu, Akira Sasahara, Masahiko Tomitori,the 17th international conference on non-contact atomic force microscopy,Tsukuba, Japan,2014/08/04-08
  • 18. Decrease in electrostatic force in a tunneling region detected by nc-AFM/STM,T. Arai, T. Ishikawa, T. Sakano, H. Ooe, N. Okabayashi, and M. Tomitori,16th International Conference on Non-contact Atomic Force Microscopy,Maryland, USA,2013/08/05-09
  • 19. Feedback control of responsible for contrast change in nc-AFM images,T. Arai, T. Ishikawa, T. Sakano, M. Tomitori,16th International Conference on Non-contact Atomic Force Microscopy,Maryland, USA,2013/08/05-09
  • 20. Relationship between force and current on resonance state between a Si tip and Si(111)7x7,T. Arai, T.Ishiawa, T. Ikeshima, M. Tomitori,NC-AFM 2012,Cesky Krumlov, Czech Republic,2012/07/01-05

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