26th Frontiers in Nanoscience and Technology
Dr. Naoya Shibata

Assistant Professor Institute of Engineering Innovation, School of Engineering, The University of Tokyo

15:00 - 16:00, September 9(Thu.) 2010

KS-III, 6th floor, Collaboration 3

Aberration-corrected Z-contrast scanning transmission electron microscopy (STEM) is a very powerful method to directly image atomic structures of surfaces and interfaces in many advanced materials. In this talk, I will review recent works using aberration-corrected STEM on grain boundary characterization in ceramics, catalysts characterization, dislocation core structure characterization and so on.

Remarks

The seminar is organized by seven tenure-track Lecturers of Schools of Materials Science, Information Science and Knowledge Science in the framework of the Research Center for Integrated Science and supported by the program “Development of Personnel System for Young Researchers in Nanotechnology and Materials Science”.
Seminar language is English. We welcome everyone who has interest in the topic.

Contact Person

Dr. Y. Yamada-Takamura (1581,yukikoyt@jaist.ac.jp) regarding this seminar.

Dr. R. Friedlein (1785,friedl@jaist.ac.jp) regarding the seminar series.